Thin Films for the physical and life sciences in high-technology applications.

The surface quality of the thin films is tested using either atomic force microscopy (AFM) or scanning tunnelling microscopy (STM).

Atomic Force Microscopy

The next tree images are AFM images with lateral size respectively of 1.6 μm x 1.6 μm, 1.1 μm x 1.1 μm and 1.1 μm x 1.1 μm. The z scale is 5 nm for the first image and 3 nm for the last two.

  • AFM on Au111 on mica
  • AFM on Au111 on mica
  • AFM on Au111 on mica

Scanning Tunneling Microscopy

The next image is a 0.5 μm x 0.5 μm STM image of a 2 month old sample kept inside its box. The Z scale is 2 nm.


STM on Au111 on mica


The size of the terraces may vary from one sample to another. We observe sometime terraces as large as 1 μm2. During the production process, we regularly control the surface quality of our films.

Au111 on mica main page