Thin Films for the physical and life sciences in high-technology applications.

PHASIS is involved in several applied research projects with both academic and industrial partners. The flexibility of PHASIS' equipment allows the production of thin films with tailored properties.

Surface quality control is a pertual challenge. PHASIS provides local probe surface analysis using Atomic Force Microscopy (AFM) and/or Scanning Tunneling Microscopy (STM).

PHASIS is therefore open to any special request. 

  • chamber wafer

    Thin film laboratory at PHASIS

  • chamber Closeup

    Close-up inside the system
    during thin film growth

  • afm wafer

    Wafer nanoscale surface analysis - Atomic Force Microscopy