PHASIS is involved in several applied research projects with both academic and industrial partners. For example, PHASIS is interested in the use of new materials to bring new insights in the field of gas sensors. Moreover, the flexibility of PHASIS' equipment allows the production of thin films with tailored properties.

Surface quality control is a pertual challenge. PHASIS provides local probe surface analysis using Atomic Force Microscopy (AFM) and/or Scanning Tunneling Microscopy (STM).

PHASIS is therefore very open to any special request.
 

Thin film laboratory at PHASIS	Close-up inside the system during thin film growth	Wafer nanoscale surface analysis - Atomic Force Microscopy